The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 2003

Filed:

Mar. 28, 2002
Applicant:
Inventors:

Tadahito Fujisawa, Tokyo, JP;

Masafumi Asano, Yokohama, JP;

Kyoko Izuha, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 9/00 ; G03C 5/00 ;
U.S. Cl.
CPC ...
G03F 9/00 ; G03C 5/00 ;
Abstract

A pattern is formed on a resist film by applying the coating f a resist film, first heat treatment, first cooling treatment, the exposure treatment, second heat treatment, second cooling treatment, and development. After the exposure treatment, at least one of the effective exposure and the focus position in the exposure treatment applied to the resist film is obtained. Then, at least one of the difference between the optimum exposure in performing the exposure by using the mask and a set value and the difference between a optimum focus position and the a value is calculated from at least one of the effective exposure obtained and the focus position obtained. Further, at least one of the exposure condition and the process condition after the exposure is calculated in accordance with the calculated difference.


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