The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Mar. 30, 2001
Applicant:
Inventors:
Sunil K. Jain, Folsom, CA (US);
Greg P. Chema, El Dorado Hills, CA (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/900 ; G01N 3/700 ;
U.S. Cl.
CPC ...
G06F 1/900 ; G01N 3/700 ;
Abstract
Tester derating factor (TDF) arrangements and methodologies providing improvements in semiconductor start-to-finish manufacturing arrangements, especially within DV testing and in the world of designing of devices and virtual simulation.