The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Jul. 26, 2002
Detlef Bahr, Karlsruhe, DE;
Norbert Kuhnmuench, Karlsruhe, DE;
Bruker Axs GmbH, Karlsruhe, DE;
Abstract
An X-ray diffractometer comprising an X-ray source ( ) from which X-rays are guided to a sample ( ) to be investigated, an X-ray detector ( ) for receiving X-rays diffracted or scattered from or reflected by the sample ( ), and a goniometer for adjustment of sequential relative angular positions between the X-ray source ( ), the sample ( ) and the X-ray detector ( ) for detecting X-ray diffraction lines, X-ray scattered signals or X-ray reflectograms of the sample ( ) to be investigated, wherein the X-rays can be guided at least sectionally along different optical paths, is characterized in that the X-rays can be guided from a position to a position along n≧2 different switchable optical paths, wherein the different optical paths are rigidly disposed relative to each other between position and position and form a unit ( ), wherein the sample ( ) assumes either position or position and wherein the switching over between the different optical paths can be effected by turning the unit ( ) relative to the sample ( ) about the sample position. Due to its considerably more compact structure compared to conventional arrangements, the inventive arrangement requires considerably less space while maintaining full relative motion of the parts, wherein the arrangement permits omission of expensive components, in particular detectors and associated measurement electronics.