The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 2003
Filed:
Oct. 26, 2000
Donald L. Wollesen, San Jose, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method is provided for obtaining an accurate image of a two-dimensional junction profile of a semiconductor device. Embodiments include sectioning a sample to be analyzed through the active transistor, either at a 90° angle to the planar surface or at a desired angle, as by a focused ion beam (FIB) apparatus. The sectioned transistor can be analyzed directly on the exposed silicon, or the exposed silicon of the cross-section can be passivated with a thin film material such as silicon dioxide, or with an undoped semiconductor material such as silicon or germanium. The electrodes (i.e., source, gate, drain and substrate electrodes) of the sample active transistor are then connected so they can be individually electrically biased. The prepared sample is placed in a conventional voltage contrast SEM, and the electrodes are selectively biased to produce a voltage contrast while being imaged by the voltage contrast SEM, thereby resulting in detailed SEM images of the active regions and depletion spreads.