The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2003
Filed:
Apr. 02, 2001
Applicant:
Inventor:
Nissim Savareigo, Ashdod, IL;
Assignee:
Orbotech Ltd., Yavne, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 1/00 ;
U.S. Cl.
CPC ...
G06K 1/00 ;
Abstract
Apparatus and method for post etching inspection of electrical circuits including an optical inspection assembly viewing an electrical circuit at various regions thereon and providing output indications of etching characteristics of the electrical circuit at the various regions and output circuitry receiving the output indications of etching characteristics of the electrical circuit at the various regions and providing an output indication of variations in the etching characteristics between at least some of the various regions.
Savareigo, Nissim. (2003). Post etch inspection system (U.S. Patent No. 6656374). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6656374
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile