The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6653054 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 25, 2003

Filed:

Jul. 25, 2001
Applicant:
Inventor:

André Schiltz, Saint Ismier, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 7/00 ; G03F 7/16 ; C08J 7/18 ;
U.S. Cl.
CPC ...
G03F 7/00 ; G03F 7/16 ; C08J 7/18 ;
Abstract

A semiconductor substrate etching masking layer onto which the pattern to be etched can be transferred by photolithography at extreme ultraviolet light wavelengths from 10 to 100 nm and which is resistant to plasma etching. An ultraviolet light semiconductor integrated circuit photolithography process and the use for fabricating a double masking layer for semiconductor substrate etching of a photo-ablation layer sensitive to extreme ultraviolet light and resistant to deep ultraviolet light and/or ultraviolet light coupled to a polymer resin layer resistant to extreme ultraviolet light and to plasma etching when the resin has been developed and sensitive to deep ultraviolet light and/or to ultraviolet light.


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Schiltz, André. (2003). Resin, a double resin layer for extreme ultraviolet light (euv) photolithography, and an extreme ultraviolet light (euv) photolithography process (U.S. Patent No. 6653054). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6653054

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