The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2003

Filed:

May. 06, 2002
Applicant:
Inventors:

Phillip Joe Brock, Sunnyvale, CA (US);

Richard Anthony DiPietro, San Jose, CA (US);

Donald Clifford Hofer, San Martin, CA (US);

Ratnam Sooriyakumaran, San Jose, CA (US);

Gregory Michael Wallraff, Morgan Hill, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 ; C07F 7/04 ; C07F 7/08 ; C07F 3/008 ; C07F 3/600 ;
U.S. Cl.
CPC ...
G03F 7/004 ; C07F 7/04 ; C07F 7/08 ; C07F 3/008 ; C07F 3/600 ;
Abstract

Polymerizable monomers having silicon containing groups that are transparent at 193 nm; and ethylenically unsaturated group are provided. Polymers from these monomers can be used in processes for forming sub-100 nm images with a chemically amplified, radiation sensitive bilayer resist. The bilayer resist is disposed on a substrate and comprises (i) a top imaging layer comprising a radiation sensitive acid generator and (ii) an organic underlayer. The bilayer resist can be used in the manufacturing of integrated circuits.


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