The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

May. 21, 2001
Applicant:
Inventors:

Duhane Lam, Vancouver, BC, CA;

Mark William Ellens, Vancouver, BC, CA;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/116 ;
U.S. Cl.
CPC ...
G01B 1/116 ;
Abstract

A method of detecting stress and strain using a powder coat finish and photoelastic techniques. A part is provided with a photoelastic layer comprising a non-opaque powder coat finish that becomes optically anisotropic when stressed. Photoelastic techniques are used to detect and measure stress and strain in the part. Fringe patterns appear in the photoelastic layer indicating the locations and magnitudes of the stress and strain when the part is illuminated with polarized light and viewed through a polarizing filter. Stress and strain resulting from applied forces are detected. Structural deformation in parts that have experienced plastic deformation is also detected. Photoelastic techniques using powder coat as a photoelastic technique are less expensive and easier to apply than traditional photoelastic coatings. Applications include testing of prototypes, stress testing, inspection and monitoring of production parts, and anywhere that viewing and measuring of stress and strain are of interest.


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