The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2003
Filed:
Feb. 10, 2003
Julie A. Campbell, Beaverton, OR (US);
Christina Colby Barsotti, Vancouver, WA (US);
LeCroy Corporation, Chestnut Ridge, NY (US);
Abstract
An electrical test probe tip of the present invention has a longitudinal axis extending from a first end to a second end and an electrically conductive interior extending substantially therebetween. A conductive exterior-most surface at least partially surrounds the electrically conductive interior. The test probe tip has a maximum length measured from the first end to the second end and has a minimum length measured from the first end to the second end. An electrically insulated surface at the first end substantially descends from the maximum length to the minimum length. The electrical test probe tip may be inserted between a target IC pin and the electrically insulated surface faces the adjacent IC pin.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile