The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2003
Filed:
May. 30, 2002
Yukiji Yoda, Kawasaki, JP;
Tomoyuki Miyazaki, Kawasaki, JP;
Yutaka Nishitsuji, Kawasaki, JP;
Yoshikazu Kobayashi, Kawasaki, JP;
Keiji Akagi, Kawasaki, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A touch signal probe comprises a fixed member, a movable member, a bias means, a drive member, a deformation touch signal processing circuit, a contact touch signal processing circuit, and a latch circuit. A stylus is attached to the movable member. The drive member relatively drives reseat position elements respectively placed on the fixed member and the movable member. The bias means restores the movable member to a still position. The deformation touch signal processing circuit generates a deformation touch signal. The contact touch signal processing circuit uses the reseat position elements as make-and-break electric contacts to generate a contact touch signal. The latch circuit inputs coordinate values every instant at which the deformation touch signal is output and stores the coordinate values as the most recent coordinate values for update, and when the contact touch signal is output, outputs the most recent coordinate values as detected coordinate values.