The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

May. 10, 2000
Applicant:
Inventors:

Akira Kikutake, Kawasaki, JP;

Masato Matsumiya, Kawasaki, JP;

Satoshi Eto, Kawasaki, JP;

Kuninori Kawabata, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 2/900 ; G11C 7/00 ;
Abstract

The present invention is a memory circuit which selects N number of segments out of M number of segments (N<M) during normal reading, wherein all the M number of segments are activated during a read test in order to drive a common data bus for testing by a plurality of sense buffers in the M number of segments. For this, test signals are supplied to a column decoder, and segment select signals, for activating the M number of segments, are generated in response to the test signal. In this way, a plurality of segments in a memory bank in a select status can be simultaneously selected to execute a read test, and the efficiency of a compression read test can be improved.


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