The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 04, 2003

Filed:

Nov. 30, 1999
Applicant:
Inventors:

Cathleen M. Daniels, Rochester, NY (US);

Raymond W. Ptucha, Honeoye Falls, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 ; H04N 1/387 ; H04N 5/222 ; G06T 1/700 ;
U.S. Cl.
CPC ...
G06K 9/32 ; H04N 1/387 ; H04N 5/222 ; G06T 1/700 ;
Abstract

The disclosed method uses empirically derived image quality data in order to determine an image resolution for a particular zoom and/or crop operation performed on an image. An acceptability value is specified for the image, e.g., a specific % acceptable, where the acceptability value relates to empirically derived image quality as perceived by a human viewer. Given selected input and output devices, an image resolution is then generated from a combination of the particular zoom and crop and the specified acceptability value. This resolution is specified as the image resolution, e.g., a minimally acceptable resolution, to produce the desired zoom and crop.

Published as:

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