The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 2003
Filed:
May. 18, 2000
Kazunori Tsutsui, Osaka, JP;
Koichi Oka, Shiga, JP;
Masayoshi Funato, Osaka, JP;
Akira Kawaguchi, Kyoto, JP;
Tetsuo Hamada, Kyoto, JP;
Michio Tsujio, Osaka, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
The present invention relates to a light scattering intensity measuring apparatus capable of measuring, as a function of the scattering angle, the intensity of the light scattered from a sample. This apparatus comprises an ellipsoidal mirror for reflecting and condensing the scattered light from a sample ; an image-forming lens disposed at the condensing point of light reflected by the ellipsoidal mirror for forming, on a camera face, the image formed on the surface of the reflection mirror ; and a camera for recording the image formed by the image-forming lens . The scattered light in a wide angle range can be detected in a very short period of time (FIG. ).