The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 21, 2003

Filed:

May. 24, 2001
Applicant:
Inventors:

Hussein I. Hanafi, Basking Ridge, NJ (US);

Jeffrey J. Brown, Fishkill, NY (US);

Wesley C. Natzle, New Paltz, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/976 ;
U.S. Cl.
CPC ...
H01L 2/976 ;
Abstract

A technique for forming a sub-0.05 &mgr;m channel length double-gated/double channel MOSFET structure having excellent short-channel characteristics as well as the double-gated/double channel MOSFET structure itself is provided herein. The inventive technique utilizes a damascene process for the fabrication of a MOSFET device with double-gate/double channel structure. The gates are present on opposite sides of a silicon film having a vertical thickness of about 80 nm or less which is present in the gate region. The silicon film serves as the vertical channel regions of the structure and connects diffusion regions that are abutting the gate region to each other. In the inventive device, the current is double that of a conventional planar MOSFET with the same physical width due to its dual channel feature.


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