The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2003
Filed:
Oct. 03, 2001
Ui Won Suh, Cincinnati, OH (US);
James Douglas Risbeck, Cincinnati, OH (US);
Other;
Abstract
A method for quality control monitoring of laser shock peening a surface of a production workpiece during which laser beam pulses form a plurality of corresponding plasmas. An acoustic signal of each laser beam pulse during a period of time during a duration of each corresponding one of the plasmas is monitored and an acoustic energy parameter value for each of the acoustic signals for each of the corresponding laser pulses is calculated. A statistical function value of the workpiece based on the acoustic energy parameter values is calculated and compared to a pass or fail criteria for accepting or rejecting the workpiece. The criteria may be based on a pre-determined correlation of test piece statistical function data such as high cycle fatigue failure data of test pieces. The statistical function value may be an average of the acoustic energy parameter values of the laser beam pulses.