The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2003

Filed:

May. 09, 2001
Applicant:
Inventors:

Tomohiro Akada, Moriyama, JP;

Kenji Murano, Hirakata, JP;

Koichi Kuraue, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 ; G01B 1/128 ;
U.S. Cl.
CPC ...
G01J 4/00 ; G01B 1/128 ;
Abstract

Light is directed to a VA (Vertical Alignment) liquid crystal panel whose optical axis is in a direction perpendicular to the panel surface in such a manner that the light is incident obliquely on the VA liquid crystal panel surface, by which birefringence that results only from the liquid crystal layer is artificially generated so that measurement of the thickness (cell gap) of the VA liquid crystal is accurately performed.


Find Patent Forward Citations

Akada, Tomohiro. (2003). Method and apparatus for measuring cell gap of va liquid crystal panel (U.S. Patent No. 6628389). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6628389

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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