The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 23, 2003

Filed:

May. 23, 2002
Applicant:
Inventors:

Jun Ohtani, Hyogo, JP;

Tomoya Kawagoe, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 ;
U.S. Cl.
CPC ...
G11C 7/00 ;
Abstract

A memory cell array is divided into a first and second sub-memory cell arrays. A built-in self-testing circuit is provided with an address replacement determining circuit which is installed in each of the first and second sub-memory cell arrays, and which, assuming that a selection of a memory cell from the first and second sub-memory cell arrays and a replacement thereof to a preliminary memory cell can be carried out mutually in an independent manner, makes a determination as to which preliminary memory cell is used for replacement, and outputs the result of determination.


Find Patent Forward Citations

Ohtani, Jun. (2003). Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell (U.S. Patent No. 6625072). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6625072

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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