The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 16, 2003
Filed:
Oct. 02, 2000
Eric Aldrich, Walnut Creek, CA (US);
Richard Pye, Burlington, MA (US);
Lyle Sherwood, Pepperell, MA (US);
Douglas W. Raymond, Orinda, CA (US);
John Burnett, Vacaville, CA (US);
Teradyne, Inc., Boston, MA (US);
Abstract
An automated optical inspection (AOI) system includes component learning integrated with the inspection of a circuit board. The AOI system includes a component learning area that can be viewed by an imaging system used to inspect the circuit board in an inspection area. The component learning area can correspond to a region proximate the inspection area. The automated optical inspection system receives board inspection and component learn requests and determines opportune times to learn new component characteristics during the board inspection process so as to minimize the impact of the learning process on the overall inspection efficiency.