The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2003

Filed:

Nov. 09, 2000
Applicant:
Inventors:

Yasushi Fukumoto, Kawasaki, JP;

Seiji Shimokawa, Kawasaki, JP;

Kenji Okabe, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 4/014 ;
U.S. Cl.
CPC ...
H01J 4/014 ;
Abstract

A CCD camera ( ) images a work to generate its image data. An imaging optical system ( ) focuses an image of the work on the CCD camera ( ). A down-projection illumination source ( ) includes at least one semiconductor light-emitting device for producing a down-projection illumination light to illuminate the work from above. An illuminating optical system ( ) joins the illumination light from the down-projection illumination source ( ) to the imaging optical system in order to lead the illumination light to the work via the imaging optical system. These optical components are mounted on a chassis ( ) to construct an imaging probe ( ), which is employed at any angle as a measuring probe of a three-dimensional tester.


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