The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2003

Filed:

Aug. 31, 2001
Applicant:
Inventor:

Chih-liang Cheng, Fremont, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method estimates the capacitance effects of an interconnect prior to routing of an integrated circuit (IC) design, as follows. The design is divided into areas. Capacitance effects for each area are estimated based on the congestion ratios within the area. The congestion ratios for each area are derived from estimations of the demand for routing resources in each area for each net in the net-list included in the IC design. Coupling vectors are derived for each area from the congestion ratios. Capacitance effects for each area are then estimated by looking up a database using the coupling vectors. The resulting per-area capacitance effects are then used to estimate capacitance in an interconnect traversing the area. The total capacitance effects due to an interconnect traversing multiple areas is determined by applying the per-area capacitance effects for the areas to the dimensions of portions of the interconnect traversing each of the areas.


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