The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 09, 2003
Filed:
May. 15, 2000
Applicant:
Inventor:
Wayne M. Needham, Gilbert, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; H01H 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ; H01H 3/102 ;
Abstract
A method and apparatus for testing integrated circuits is described. The method and apparatus provide a nearly constant power supply current load on the test power supply, and a nearly constant thermal load on the cooling system. This promotes more reliable and repeatable testing of production integrated circuits. A dummy load, in thermal contact with a device under test and the cooling system, consumes a value of current complementary to the current consumed by the device under test, which is under the control of a series of enhanced test vectors.