The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6616784 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 09, 2003

Filed:

Apr. 11, 2001
Applicant:
Inventors:

Wen-Tung Chang, Hsinchu, TW;

Hsing-Shuang Chou, Hsinchu Hsien, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/28 ; G01N 1/32 ;
U.S. Cl.
CPC ...
G01N 1/28 ; G01N 1/32 ;
Abstract

A fabrication method for a transmission electron microscope (TEM) slide is described. A die having device structures formed thereon is provided. A thermal adhesive fills the surface of device structures formed on the die. The thermal adhesive is covered by a glass piece. A polishing step is performed to a non-device side of the die to form a thin sheet from the die. The glass piece is removed to expose the thermal adhesive. A sacrificial layer is then formed above the exposed thermal adhesive on the thin sheet. A slicing step is performed to form a TEM slide from the thin sheet.


Find Patent Forward Citations

Chang, Wen-Tung. (2003). Method for fabricating transmission electron microscope (U.S. Patent No. 6616784). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6616784

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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