The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2003

Filed:

May. 01, 2002
Applicant:
Inventors:

Chu-Hua Lee, Hsinchu, TW;

Pi-Fen Chen, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/00 ;
U.S. Cl.
CPC ...
H03M 1/00 ;
Abstract

An open-loop data recovery apparatus and method utilizing an oversampling technique is provided, by which the occurrence of data transitions is counted and a proper sampling clock phase is decided. Counters with variable thresholds are used to monitor the occurrence of phase transitions for a phase selection circuit to determine a preferred phase for recovery of sampled data. The thresholds of the counters are further adjusted in reference with the preferred phase decided by the phase selection circuit.


Find Patent Forward Citations

Lee, Chu-Hua. (2003). Oversampling data recovery apparatus and method (U.S. Patent No. 6611219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6611219

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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