The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2003
Filed:
Mar. 27, 2000
Matthew James Brinkman, Brush Prairie, WA (US);
Joel Wayne Mietzner, Vancouver, WA (US);
Marshall Rowe, Chicago, IL (US);
SEH America, Inc., Vancouver, WA (US);
Abstract
A universal system and method are provided for collecting a plurality of different types of process data, including particle measurement data, from remote locations without requiring manual intervention. The universal system includes a plurality of particle measurement instruments disposed at respective locations distributed about a facility in order to collect particle data. The universal system also includes a process data collection device for providing process data other than particle data, such as temperature, pressure, humidity level, switch position or the like. The universal system further includes a central computer that is located remote from the plurality of particle measurement instruments and from the process data collection device and that is interconnected with the plurality of particle measurement instruments and the process data collection device by means of a computer network. As such, the particle data collected by the respective particle measurement instruments and the other process data collected by the process data collection device can be transmitted across the computer network and received by the central computer that is located remote from the respective locations at which the process data is collected. Advantageously, however, the process data collection device provides the particle data to the central computer in a manner that is independent of the plurality of particle measurement instruments, thereby greatly increasing the flexibility of the system and method. Thereafter, the particle data and the process data can be processed at the central computer.