The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6604295 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 12, 2003

Filed:

Mar. 13, 2001
Applicant:
Inventors:

Kunitoshi Nishimura, Tsukuba, JP;

Kazuhiko Hidaka, Tsukuba, JP;

Kiyokazu Okamoto, Tsukuba, JP;

Assignee:

Mitutoyo Corporation, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/20 ;
U.S. Cl.
CPC ...
G01B 5/20 ;
Abstract

A fine feed mechanism ( ) and a coarse feed mechanism ( ) respectively for minutely and greatly displacing a stylus ( ) is provided to a microscopic geometry measuring device ( ), so that the respective mechanisms ( ) are combinedly actuated for easily controlling the movement of the stylus ( ) in a wide range at a short time. Further, a movable balancing portion ( ) moving in a direction opposite to a movable driving portion ( ) is provided to the fine feed mechanism ( ). Since a reaction force caused by the movement of the movable driving portion ( ) is cancelled by another reaction force caused by the movement of the movable balancing portion ( ) at a fixed portion ( ), no mechanical interference is caused between the respective mechanisms ( ), thus accurately controlling the movement of the stylus ( ).


Find Patent Forward Citations

Nishimura, Kunitoshi. (2003). Microscopic geometry measuring device (U.S. Patent No. 6604295). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6604295

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