The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 29, 2003
Filed:
Jul. 27, 2001
Applicant:
Inventor:
Hiroyoshi Kazumori, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 3/714 ;
U.S. Cl.
CPC ...
H01J 3/714 ;
Abstract
A scanning electron microscope comprises: an electron gun for emitting an electron beam; a system of condenser lenses; scanning coils; and an objective lens having inner and outer magnetic polepieces to form a magnetic field lens below the lower ends of the polepieces. The inner and outer polepieces are provided with mutually communicating bores via which the backscattered electron detector can be withdrawably inserted into the electron beam path within the objective lens.
Kazumori, Hiroyoshi. (2003). Scanning electron microscope (U.S. Patent No. 6600156). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6600156
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile