The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Jan. 25, 2001
Yoshiro Kawano, Tokyo, JP;
Chikara Abe, Hicksville, NY (US);
Katsuyuki Abe, Tokyo, JP;
Keisuke Tamura, Tokyo, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A microscope for use in total internal reflection fluorescence microscopy (TIRFM) is provided. The microscope includes a first white-light source for directing light along a first optical path; an annular slit member disposed in the first optical path, the annular slit member having an annular slit for blocking all but an annulus of light corresponding to the annular slit; and an objective lens for directing the annulus of light to a specimen such that TIRFM of the specimen is achieved. Also provided are various ways for converting the microscope to and from a TIRFM microscope and a conventional microscope.