The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 22, 2003
Filed:
Sep. 20, 2000
Applicant:
Inventors:
Vladimir Vladimirovich Talanov, Greenbelt, MD (US);
Hans M. Christen, Greenbelt, MD (US);
Robert Moreland, Edgewater, MD (US);
Assignee:
Neocera, Inc., Beltsville, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/704 ; G01R 2/726 ; G01R 3/1308 ; G01N 2/300 ;
U.S. Cl.
CPC ...
G01R 2/704 ; G01R 2/726 ; G01R 3/1308 ; G01N 2/300 ;
Abstract
An apparatus for localized measurements of complex permittivity of a material is provided. A probe ( ) analyzes the complex permittivity of a sample ( ), the probe ( ) having a balanced two conductor transmission line ( ) formed of conductive segments ( and ). A probing end ( ) of the transmission line ( ) is brought within close proximity of sample ( ) and an opposite end ( ) of the transmission line is connected to a terminating plate ( ) to form a resonator structure ( ) for measurement of the complex permittivity of sample ( ).