The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Jul. 17, 2000
Takahiro Yasui, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A method of analyzing a repair of failure memory cell in a memory is provided, which is capable of searching a must-repair of a memory at high speed and of performing a simulation process for relieving a must-repair at high speed at the time point when it has been detected. There are provided a row address failure number counter/memory for counting the number of failure memory cells on each row address in the row address direction and storing it and a column address failure number counter/memory for counting the number of failure memory cells on each column address in the column address direction and storing it. The stored value in either one counter/memory is read out and the number of failure memory cells on each address is compared with the number of spare lines. The state that the number of failure memory cells on each address is greater than the number of spare lines is determined to be a must-repair, and a simulation process for relieving the failure is executed at the time point when the must-repair has been detected.