The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2003
Filed:
Feb. 14, 2001
Donald M. Metzger, Colorado Springs, CO (US);
David B. Marshall, Colorado Springs, CO (US);
Curtis C. Hainds, Colorado Springs, CO (US);
Credence Systems Corporation, Fremont, CA (US);
Abstract
A system for determining scattering parameters (S-parameters) characterizing the behavior of a network applies a wideband stimulus signal containing multiple signal components as input to the network. The system then measures incident and reflected waveforms at all of the network's ports, digitizes and converts the measured waveforms from time domain to frequency domain data, and then computes the S-parameters values for each frequency component of interest from the frequency domain data for that frequency. The system also determines its own error coefficients (E-coefficients) for each frequency of interest from data collected during a sequence of measurements in response to either a sinusoid or a wideband signal and adjusts the computed S-parameter values accordingly.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile