The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2003

Filed:

May. 29, 2002
Applicant:
Inventors:

Yung-Min Cheng, Yungkang, TW;

Chun-Sheng Wang, Shan-Hua, TW;

Ming-Hui Lin, Tainan, TW;

Sheng-Guei Chang, Tainan, TW;

Juei-Feng Hsu, Tainan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

Within both an electrical test apparatus for electrically testing a substrate, and a method for electrically testing the substrate while employing the electrical test apparatus, there is provided for an automatic selection of an electrical test program, absent operator intervention, once having identified a substrate. Due to the absence of operator intervention, the substrate is more accurately electrically tested.


Find Patent Forward Citations

Cheng, Yung-Min. (2003). Microelectronic fabrication electrical test apparatus and method providing enhanced electrical test accuracy (U.S. Patent No. 6590408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6590408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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