The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6590383 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 08, 2003

Filed:

Aug. 07, 2002
Applicant:
Inventors:

Tsuyoshi Yamashita, Tokyo, JP;

Toshiyuki Kiyokawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

A contact arm for bringing ICs to be tested to contact a contact portion, includes a holding head for holding said electronic devices, a floating mechanism provided between a drive mechanism for moving close to or away from said contact portion and said holding head for supporting said holding head movable about said drive mechanism, a diaphragm cylinder provided between said drive mechanism and said holding head for adjusting a relative pressing pressure from said drive mechanism to said holding head. A plurality of diaphragm cylinders are provided to one holding head.


Find Patent Forward Citations

Yamashita, Tsuyoshi. (2003). Contact arm and electronic device testing apparatus using the same (U.S. Patent No. 6590383). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6590383

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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