The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Feb. 04, 2000
Kathirgamar Aingaran, Sunnyvale, CA (US);
Manjunath D. Haritsa, San Jose, CA (US);
Lakshminarasimhan Varadadesikan, Santa Clara, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Method and apparatus for detecting and analyzing effects of noise in a digital circuit that arises from a coupling of signals produced by switching of a first gate and a second gate in a timed relationship. Where each of a first gate and a second gate can switch within a selected switching time interval, the gate switching effects are combined and the second gate output signal is analyzed with reference to the first gate input signal. Otherwise, the gate switching effects are not combined. When the second gate output signal satisfies at least one of three criteria, this condition is interpreted as indicating that the second gate permits propagation of a noise pulse produced at the first gate.