The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 01, 2003
Filed:
Jun. 20, 2001
Robert Edward Aldaz, Carol Stream, IL (US);
Theodore A. Khoury, Evanston, IL (US);
Advantest, Corp., Tokyo, JP;
Abstract
A probe contact system is capable of adjusting distances between tips of the contactors and contact targets with simple and low cost mechanism. The probe contact system includes a contact substrate having a plurality of contactors thereon, a probe card for fixedly mounting the contact substrate, a conductive elastomer provided between the contact substrate and the probe card, a gap sensor for measuring a distance between the contact substrate and the contact targets, a probe card ring attached to a frame of the probe contact system for mechanically coupling the probe card to the frame, and a plurality of connection members for connecting the probe card to the probe card ring while adjusting a gap between the probe card and the probe card ring.