The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2003

Filed:

Apr. 05, 2002
Applicant:
Inventors:

Reima Tapani Laaksonen, Dallas, TX (US);

Padmanabh Krishnagiri, Allen, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/100 ;
U.S. Cl.
CPC ...
H01L 2/100 ;
Abstract

A method for dynamically controlling a semiconductor manufacturing process for producing a semiconductor component includes performing a plurality of process segments. Each respective process segment is performed for a respective processing interval. The method includes the steps of: (a) determining a relationship among respective process intervals for at least two particular process segments of the plurality of process segments; (b) determining a first respective process interval required for a first particular process segment to effect a desired result in the semiconductor component; and (c) using the relationship to establish the respective process interval required for at least one selected particular process segment in order to fix the respective process interval for a controlled process segment other than the at least one selected particular process segment.


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