The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2003

Filed:

Oct. 25, 2000
Applicant:
Inventors:

Yu Zhou, Libertyville, IL (US);

David Yu, Bloomingdale, IL (US);

Robert Edward Aldaz, Carol Stream, IL (US);

Theodore A. Khoury, Evanston, IL (US);

Assignee:

Advantest, Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ;
U.S. Cl.
CPC ...
H01L 2/1302 ;
Abstract

A contact structure for establishing electrical connection with contact targets. The contact structure is formed of a contact substrate and a plurality of contactors. The contactor has a contact portion which is oriented in a vertical direction to form a contact point, an intermediate portion which is inserted in a through hole provided on the contact substrate, and a base portion having a base end which functions as a contact pad and a spring portion provided between the base end and the intermediate portion for producing a resilient contact force when the contactor is pressed against the contact target.


Find Patent Forward Citations

Zhou, Yu. (2003). Contact structure and production method thereof and probe contact assembly using same (U.S. Patent No. 6579804). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6579804

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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