The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6579792 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 17, 2003

Filed:

May. 24, 2001
Applicant:
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/144 ;
U.S. Cl.
CPC ...
H01L 2/144 ;
Abstract

The invention relates to a method of manufacturing a semiconductor device, comprising the provision of a substrate ( ) having a dielectric layer ( ) on this substrate ( ), a conductive layer ( ) on the dielectric layer ( ), an inorganic anti-reflection coating ( ) on the conductive layer ( ), and a resist mask ( ) on the inorganic anti-reflection coating ( ). The method further comprises the following steps: patterning the inorganic anti-reflection coating ( ) by means of the resist mask ( ), patterning the conductive layer ( ) by etching down to the dielectric layer ( ), removing the resist mask ( ), and removing the inorganic anti-reflection coating ( ). According to the invention, the inorganic anti-reflection coating ( ) is removed by means of a dry etch, using a polymerizing gas. It is achieved by this that no or hardly any changes in the critical dimension will occur.


Find Patent Forward Citations

De Laat, Walterus Theodorus Franciscus Maria. (2003). Method of manufacturing a semiconductor device (U.S. Patent No. 6579792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6579792

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