The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2003

Filed:

Feb. 26, 2001
Applicant:
Inventors:

Taichi Yanaru, Itami, JP;

Masataka Okabe, Itami, JP;

Hirofumi Ohtsuka, Itami, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/700 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01N 3/700 ; G06F 1/900 ;
Abstract

In a sampling inspection managing system, for each processing step, a setting is made on a processing flow table as to whether the processing step concerned is a step for determining the sampling inspection frequency of a specific inspection step. For a processing step which is set as “being a step for determining the sampling inspection frequency”, the inspection frequency of the specific inspection step is set on a sampling frequency setting table for every kind of product to be processed. Further, for the processing step, the processing number of lots is counted for every kind of product in a count table, and, on the basis of the processing number thus counted, a judgment is made as to whether each lot is a lot to be inspected in the specific inspection step. The judgment result is stored as information for the lot in a lot table. Accordingly, the inspection can be carried out at an inspection frequency suitable for every kind of product.


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