The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 03, 2003

Filed:

Oct. 30, 2001
Applicant:
Inventor:

Kwok Tam, Edison, NJ (US);

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

A system and method for accurately reconstructing an image of a ROI (region of interest) within a long object by removing components associated with data contamination. In one aspect, an image reconstruction method comprises collecting a set of image data along a spiral scan path of a ROI (region of interest) portion of an object, identifying contaminated data within the collected set of image data, the contaminated data corresponding to image data associated with an object outside the ROI, and reconstructing an image of the ROI using the set of image data less the contaminated data.


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