The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6574168 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 03, 2003

Filed:

Sep. 05, 2001
Applicant:
Inventor:

Mishio Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F 1/000 ; G01R 1/302 ; G01R 2/500 ;
U.S. Cl.
CPC ...
G04F 1/000 ; G01R 1/302 ; G01R 2/500 ;
Abstract

A time measuring device includes: an input signal detecting unit for detecting three or more edges in an input signal and to output three or more detection signals in parallel, the three or more detection signals changing based on the three or more edges, respectively; a converting unit for converting phase differences between change timings of the detection signals and clock edges in a reference clock having a predetermined operating frequency into analog voltage values, respectively; a counting unit for counting, from change timings of at least two of the detection signals, number of the clock edges between the clock edges from which at least two detection signals are respectively delayed by the phase differences corresponding to at least two detection signals; an operating unit for calculating a time interval between edges of the three or more edges based on the analog voltage values and the number of clock edges.


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Hayashi, Mishio. (2003). Time measuring device and testing apparatus (U.S. Patent No. 6574168). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6574168

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