The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2003
Filed:
Apr. 20, 1999
Michael A. Gauland, Hillsboro, OR (US);
Steven K. Sullivan, Beaverton, OR (US);
Roy I. Siegel, Portland, OR (US);
Frederick A. Azinger, Portland, OR (US);
Charles L. Saxe, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
Multiple views of the signal are generated by a time-sharing use of the oscilloscope's acquisition hardware. The instrument software makes a set of measurements of the input signal, and from the results of those measurements classifies the input signal as to type. Signals of particular types implicitly select suites of views of the signal. The operator sees examples of the other views available while a related view is the main view. Alternate views can be “live” miniature views, and displayed alongside in simplified form, alongside the main view. By clicking on them, these alternative views may be made to become the main view. The operator can add and modify views. Each view comes with a set of measurements that are automatically performed and the results are displayed on the screen as text annotation to the waveform. A different view of the signal comes with different automatic measurements, and presents the results of these measurements as annotations to the waveform image. These next alternative setups may be miniature “live” displays.