The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 06, 2003
Filed:
May. 09, 2001
Koichi Sogawa, Hyogo, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A method of detecting a position of a size check pattern on a substrate by using a size check apparatus so as to measure a size of the size check pattern for a purpose of checking precision of production, comprising the steps of a) providing image recognition assisting patterns on the substrate on both sides of a portion to be measured of the size check pattern, b) setting the size check apparatus to have an image recognition area that includes both the size check pattern and the image recognition assisting patterns, and c) detecting the position of the size check pattern by use of the size check apparatus based on the size check pattern and the image recognition assisting patterns.