The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2003

Filed:

Jan. 12, 2000
Applicant:
Inventors:

Steven Altschuler, Redmond, WA (US);

David V. Ingerman, Princeton, NJ (US);

Lani Wu, Redmond, WA (US);

Lei Zhao, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ; G06F 1/518 ;
U.S. Cl.
CPC ...
G06F 1/700 ; G06F 1/518 ;
Abstract

A pattern lattice data space as a framework for analyzing data, in which both schema-based and statistical analysis are accommodated, is defined. Ways to manage the size of the lattice structures in the pattern lattice data space are described. Utilities to classify or cluster, search (find similar data), or relate data using lattice fragments in the pattern lattice data space are also described. Superpattern cone or lattice generation function, which may be used by the classification and clustering functions, is also described. In addition, a subpattern cone or lattice generation process, which may be used by the search (find similar data) and data relating functions, is also described. Finally, a function to label, in readily understandable “pidgin”, categories which classify information, is also described.

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