The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 22, 2003

Filed:

Jan. 23, 2001
Applicant:
Inventors:

Christopher B. Cooper, Boise, ID (US);

Ming-Bo Liu, Boise, ID (US);

Chris G. Martin, Boise, ID (US);

Troy A. Manning, Meridian, ID (US);

Stephen L. Casper, Boise, ID (US);

Charles H. Dennison, Meridian, ID (US);

Brian M. Shirley, Boise, ID (US);

Brian L. Brown, Allen, TX (US);

Shubneesh Batra, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/04 ;
U.S. Cl.
CPC ...
G11C 7/04 ;
Abstract

A method for storing a temperature threshold in an integrated circuit includes measuring operating parameters of the integrated circuit versus temperature, calculating a maximum temperature at which the integrated circuit performance exceeds predetermined specifications and storing parameters corresponding to the maximum temperature in a comparison circuit in the integrated circuit by selectively blowing fusable devices in the comparison circuit. The fusable devices may be antifuses. As a result, the integrated circuit is able to provide signals to devices external to the integrated circuit to indicate that the integrated circuit may be too hot to operate properly.


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