The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 22, 2003
Filed:
Apr. 06, 2001
Paul Magnin, Andover, MA (US);
John W. Goodnow, Arlington, MA (US);
Christopher L. Petersen, Carlisle, MA (US);
Joseph Schmitt, Andover, MA (US);
LightLab Imaging, LLC, Westford, MA (US);
Abstract
Methods and apparatuses are provided for performing optical imaging on a sample. The method and apparatuses continually adjust the path-length of a reference arm or data acquisition in a manner such that imaging information is obtained only from a longitudinal range that contains a selective portion of a sample from which imaging information is to be obtained. The apparatuses include a starting point adjustment device that determines a point with respect to a sample at which imaging information collection is to be started. A controller then controls a second scanning mechanism, in addition to a first scanning mechanism, such that imaging information is obtained only from a longitudinal range that contains a selective portion of a sample from which imaging information is to be obtained. In this way, the amount of data collected can be reduced to that within the area of interest.