The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 08, 2003
Filed:
Jan. 18, 2001
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
An LSI testing apparatus of the invention comprises: a plurality of pins P , P , . . . PN; function units and which supply the pins with LSI testing signals, which have functions for making judgments on tests, and which are furnished for each of the pins; and clock mask function units A and B furnished on the input side of each function unit. Upon testing, any unused pin and function are detected so as to mask the clock mask function unit corresponding to the detected pin and function, whereby power dissipation is reduced in terms of unused pins and functions.