The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 08, 2003

Filed:

Sep. 11, 2000
Applicant:
Inventor:

Shinji Iino, Nirasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/100 ;
U.S. Cl.
CPC ...
G01R 3/100 ;
Abstract

A probing apparatus is adapted for high-speed measurement and used for inspecting the electric characteristics of an object under inspection. The probing apparatus is provided with a probing apparatus main body, a contactor arranged inside the probing apparatus main body, pin electronics including a plurality of electronic circuits and arranged in a transmission line that is provided for transmission of inspection signals between the contactor and a tester located outside the probing apparatus, the electronic circuits being made of at least one integrated circuit, an interposer for electrically connecting the pin electronics and the contactor together, and a cooling unit for cooling the pin electronics.


Find Patent Forward Citations

Iino, Shinji. (2003). High-speed probing apparatus (U.S. Patent No. 6545493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6545493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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