The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2003

Filed:

Oct. 02, 2000
Applicant:
Inventors:

Andrej A. Zolotykh, Moskovskaya Oblast, RU;

Elyar E. Gasanov, Moscow, RU;

Alexander S. Podkolzin, Moscow, RU;

Valery B. Kudryavtsev, Moscow, RU;

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/715 ;
U.S. Cl.
CPC ...
G06F 1/715 ;
Abstract

Provided are systems and techniques for optimizing an integrated circuit design, in which a critical zone is identified in an integrated circuit design and a plurality of alternative identities are applied in the critical zone in order to obtain a corresponding plurality of outcomes. Alternative representations are then identified as those of the plurality of outcomes pursuant to which at least one of ramptime and timing are improved, and a best one of the alternative representations is selected to replace into the critical zone based on specified priorities which include: (i) selecting based on reduction in ramptime violation; (ii) selecting from among alternative representations that preserve cell area based on timing improvement; and (iii) if all alternative representations increase cell area, selecting based on an evaluation of a relationship between timing decrement and area increment.


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