The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2003
Filed:
Jun. 27, 2001
Applicant:
Inventors:
Joffre F. Bernard, Redwood City, CA (US);
Minh Quoc Tran, Milpitas, CA (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
A method is provided for X-ray imaging and analyzing grain boundaries, nodules or extrusions, voids, and separations or delaminations in conductive layers under dielectric capping layers in integrated circuit interconnects.
Bernard, Joffre. (2003). Imaging of integrated circuit interconnects (U.S. Patent No. 6541286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6541286
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile