The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2003
Filed:
Nov. 12, 1999
Applicant:
Inventor:
Takeshi Hashizume, Hyogo, JP;
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/138 ;
U.S. Cl.
CPC ...
G01R 3/138 ;
Abstract
In a semiconductor integrated circuit device supporting a boundary scan test, the state of an I/O cell is set under the control of a DC test control circuit through a boundary scan register utilized for the boundary scan test for setting an external terminal connected with a pad in a desired state. A semiconductor integrated circuit device allowing execution of a DC test without increasing the circuit area and signal propagation delay is provided.